Fault, Interrupted: How RIFT Reinvents Reliability for the LLM Hardware Era
Opening — Why this matters now Modern AI accelerators are magnificent in the same way a glass skyscraper is magnificent: shimmering, efficient, and one stray fracture away from a catastrophic afternoon. As LLMs balloon into the tens or hundreds of billions of parameters, their hardware substrates—A100s, TPUs, custom ASICs—face reliability challenges that traditional testing workflows simply cannot keep up with. Random fault injection? Too slow. Formal methods? Too idealistic. Evolutionary search? Too myopic. ...